2022

Snelgrove, Matthew ORCID: 0000-0003-0344-1146, McFeely, Caitlin ORCID: 0000-0002-0447-8250, Hughes, Greg ORCID: 0000-0003-1310-8961, Weiland, C., Woicik, J.C., Shiel, Kyle, Mani González, Pierre Giovanni ORCID: 0000-0001-6993-2349, Ornelas, Carlos ORCID: 0000-0002-4229-3038, Solís-Canto, Óscar ORCID: 0000-0002-6972-0714, Cherkaoui, Karim ORCID: 0000-0002-7062-5570, Hurley, Paul K. ORCID: 0000-0001-5137-721X, Yadav, Pravind ORCID: 0000-0002-7267-9142, Morris, Michael A. ORCID: 0000-0001-8756-4068, McGlynn, Enda ORCID: 0000-0002-3412-9035 and O'Connor, Robert ORCID: 0000-0001-5794-6188 (2022) Growth chemistry and electrical performance of ultrathin alumina formed by area selective vapor phase infiltration. Microelectronic Engineering, 266 . ISSN 0167-9317

2010

Wong, Chiu Soon, Bennett, N.S., McNally, Patrick J. ORCID: 0000-0003-2798-5121, Galiana, B., Tejedor, P., Benedicto, M., Molina-Aldareguia, J.M., Monaghan, S., Hurley, Paul K. ORCID: 0000-0001-5137-721X and Cherkaoui, K. (2010) Multi-technique characterisation of MOVPE-grown GaAs on Si. Microelectronic Engineering, 88 (4). pp. 472-475. ISSN 0167-9317

2009

Miranda, E., O'Connor, E., Cherkaoui, K., Monaghan, S., Long, R., O'Connell, Deborah, Hurley, Paul K. ORCID: 0000-0001-5137-721X, Hughes, Greg ORCID: 0000-0003-1310-8961 and Casey, Patrick (2009) Electrical characterization of the soft breakdown failure mode in MgO layers. Applied Physics Letters, 95 (1). 012901-1. ISSN 0003-6951

2008

Cherkaoui, K., Monaghan, S., Negara, M.A., Modreanu, M., Hurley, Paul K. ORCID: 0000-0001-5137-721X, O'Connell, Deborah, McDonnell, Stephen, Hughes, Greg ORCID: 0000-0003-1310-8961, Wright, S., Barklie, R.C., Bailey, P. and Noakes, T.C.Q. (2008) Electrical, structural, and chemical properties of HfO₂ films formed by electron beam evaporation. Journal of Applied Physics, 104 (6). 064113-1. ISSN 0021-8979