2008

O'Reilly, Lisa, Horan, Ken, McNally, Patrick J. ORCID: 0000-0003-2798-5121, Bennett, N.S., Cowern, N.E.B., Lankinen, Aapo, Sealy, B.J., Gwilliam, R.M., Noakes, T.C.Q. and Bailey, P. (2008) Constraints on micro-Raman strain metrology for highly doped strained Si materials. Applied Physics Letters, 92 (23). ISSN 1077-3118

Cherkaoui, K., Monaghan, S., Negara, M.A., Modreanu, M., Hurley, Paul K. ORCID: 0000-0001-5137-721X, O'Connell, Deborah, McDonnell, Stephen, Hughes, Greg ORCID: 0000-0003-1310-8961, Wright, S., Barklie, R.C., Bailey, P. and Noakes, T.C.Q. (2008) Electrical, structural, and chemical properties of HfO₂ films formed by electron beam evaporation. Journal of Applied Physics, 104 (6). 064113-1. ISSN 0021-8979

1994

Moriarty, Philip, Murphy, B., Roberts, Liam S., Cafolla, Attilio A., Hughes, Greg ORCID: 0000-0002-1358-9032, Koenders, L. and Bailey, P. (1994) Photoelectron core-level spectroscopy and scanning-tunneling-microscopy study of the sulfur-treated GaAs(100) surface. Physical Review B, 50 (19). p. 14237. ISSN 0163-1829